W&P Attends Birth Injury Seminar

Posted on March 07, 2018

Weiss & Paarz lawyers Pamela Brown-Jones, Esq., R.N. and John Mueller, Esq. attended AAJ’s Electronic Fetal Monitoring in Birth Injury Cases Seminar in Philadelphia to learn about recent advancements in electronic fetal monitoring (EFM).  Continuous EFM is used in 85% of all deliveries in the United States. It is a critical tool in identifying fetal distress and limiting the risk of infant death, cerebral palsy, hypoxic-ischemic encephalopathy (HIE),  periventricular leukomalacia (PVL), seizure disorders, and developmental delays.  Thorough understanding of EFM is essential to properly evaluate the merits of any birth injury claim.

To learn more about birth injuries, visit our birth injury attorneys page. To learn more about the Electronic Fetal Monitoring seminar, visit the American Association for Justice’s informational page here.